NIMTE OpenIR  > 2018专题
In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy
Huang, Shiqiang; Cheong, Ling-Zhi; Wang, Shuwei; Wang, Deyu; Shen, Cai
2018
Source PublicationAPPLIED SURFACE SCIENCE
Volume452Pages:67-74
AbstractSilicon is one of the most promising anode materials for lithium ion batteries because of its extremely high theoretical capacity. However, silicon suffers from mechanical degradation caused by huge volume change and unstable solid electrolyte interphase (SEI) layers. Herein, we report an in situ electrochemical atomic force microscopy (EC-AFM) method to directly visualize the surface topography and analyze Young's modulus of micron-sized (Micron-Si) and nano-sized (Nano-Si) silicon electrodes. Our results show Micron-Si electrodes experienced volume expansion and contraction process which resulted in continuous growth of a thick but soft SEI layer on the surface. In contrast, Nano-Si electrodes demonstrate a thin SEI layer due to absence of volume expansion and contraction process. Young's modulus value shows that the SEI film of Nano-Si electrodes is harder than that of the Micron-Si electrodes. Ex situ XPS analysis reveals that Nano-Si electrodes are composed of mainly inorganic components particularly LiF and carbonate-like species which might contribute to the increased hardness. Results from present study may be helpful to build better SEI layer with good Young's modulus to buffer volume expansion of Si. (C) 2018 Published by Elsevier B.V.
KeywordSolid-electrolyte Interphase Lithium-ion Batteries Fluoroethylene Carbonate Thin-films Performance Li Lnterphase Lithiation Afm Spectroscopy
Subject AreaChemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
Language英语
Document Type期刊论文
Identifierhttp://ir.nimte.ac.cn/handle/174433/17202
Collection2018专题
Recommended Citation
GB/T 7714
Huang, Shiqiang,Cheong, Ling-Zhi,Wang, Shuwei,et al. In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy[J]. APPLIED SURFACE SCIENCE,2018,452:67-74.
APA Huang, Shiqiang,Cheong, Ling-Zhi,Wang, Shuwei,Wang, Deyu,&Shen, Cai.(2018).In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy.APPLIED SURFACE SCIENCE,452,67-74.
MLA Huang, Shiqiang,et al."In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy".APPLIED SURFACE SCIENCE 452(2018):67-74.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Huang, Shiqiang]'s Articles
[Cheong, Ling-Zhi]'s Articles
[Wang, Shuwei]'s Articles
Baidu academic
Similar articles in Baidu academic
[Huang, Shiqiang]'s Articles
[Cheong, Ling-Zhi]'s Articles
[Wang, Shuwei]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Huang, Shiqiang]'s Articles
[Cheong, Ling-Zhi]'s Articles
[Wang, Shuwei]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.