晶体硅体少子寿命的测试方法

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	晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法
	叶继春; 潘淼; 高平奇; 韩灿
	2017-08-25
Application Date	2014-11-21
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Application Number	2147483647
Agency	华进联合专利商标代理有限公司北京分公司
Document Type	专利
Identifier	http://ir.nimte.ac.cn/handle/174433/21219
Collection	专利成果
Affiliation	中国科学院宁波材料技术与工程研究所
First Author Affilication	中国科学院宁波材料技术与工程研究所
Recommended Citation GB/T 7714	叶继春,潘淼,高平奇,等. 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法[P]. 2017-08-25.

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