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晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法
叶继春; 潘淼; 高平奇; 韩灿
2017-08-25
Application Date2014-11-21
晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法; 晶体硅体少子寿命的测试方法
Application Number2147483647
Agency华进联合专利商标代理有限公司北京分公司
Document Type专利
Identifierhttp://ir.nimte.ac.cn/handle/174433/21219
Collection专利成果
Affiliation中国科学院宁波材料技术与工程研究所
First Author Affilication中国科学院宁波材料技术与工程研究所
Recommended Citation
GB/T 7714
叶继春,潘淼,高平奇,等. 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法, 晶体硅体少子寿命的测试方法[P]. 2017-08-25.
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